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IBM Systems Journal  
Volume 41, Number 3, 2002
Artificial Intelligence
 Table of contents: arrowHTML arrowPDF arrowASCII   This article: arrowHTML arrowPDF arrowASCII arrowCopyright info
   

Using a constraint satisfaction formulation and solution techniques for random test program generation - Author bios

by E. Bin, R. Emek, G. Shurek and A. Ziv

Biographical sketches of authors

Eyal Bin   IBM Research Division, Haifa Research Laboratory, Haifa 31905, Israel (electronic mail: bin@il.ibm.com). Mr. Bin is a graduate of the Technion, Israel Institute of Technology, where he received a B.Sc. degree in computer engineering in 1988, and an M.Sc. degree in electrical engineering in 1991. Mr. Bin joined the Haifa Research Lab in 1991 as a research staff member, and was involved in physical design technologies, including automatic layout generation and waveform planing. Since joining the Verification Technologies Department in 1999, Mr. Bin has led the micro-architecture test generator activity for microprocessors in IBM. His other research interests include constraint satisfaction problems and self-stabilizing distributed systems.

Roy Emek   IBM Research Division, Haifa Research Laboratory, Haifa 31905, Israel (electronic mail: emek@il.ibm.com). Mr. Emek joined the Haifa Research Lab as a research staff member in 1998. Currently, he is the technical lead for X-Gen, a system-oriented random test program generator. His main research areas include hardware verification and constraint satisfaction techniques.

Gil Shurek   IBM Research Division, Haifa Research Laboratory, Haifa 31905, Israel (electronic mail: shurek@il.ibm.com). Mr. Shurek has been a research staff member at the Haifa Research Laboratory since 1991. He received his B.Sc. degree in computer engineering and his M.Sc. in computer science from the Technion, Israel Institute of Technology, in 1987 and 1991, respectively. His research interests include test program generation, shared memory models, constraint satisfaction, object-oriented modeling, and formal verification techniques.

Avi Ziv   IBM Research Division, Haifa Research Laboratory, Haifa 31905, Israel (electronic mail: aziv@il.ibm.com). Dr. Ziv received his B.Sc. degree in computer engineering from the Technion, Israel Institute of Technology, in 1990, and his M.Sc. and Ph.D. degrees in electrical engineering from Stanford University, in 1992 and 1995, respectively. Since joining the Verification Technologies Department at the IBM Haifa Research Lab as a research staff member in 1996, Dr. Ziv has been involved in several activities in the fields of testing and reliability of software and hardware systems, and the high-level modeling of hardware systems. His other research interests include fault-tolerant computing and parallel and distributed systems.