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by M. Butcher, H. Munro, and T. Kratschmer |
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Cited references
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M. Fewster and D. Graham, Software Test Automation, ACM Press Books, New York (1999), pp. 203–208.
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R. Chillarege, I. Bhandari, J. Chaar, M. Halliday, D. Moebus, B. Ray, and M. Y. Wong, “Orthogonal Defect Classification—A Concept for In-Process Measurement,” IEEE Transactions on Software Engineering 18, 943–956 (November 1992).
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J. K. Chaar, M. J. Halliday, I. S. Bhandari, and R. Chillarege, “In-Process Evaluation for Software Inspection and Test,” IEEE Transactions on Software Engineering 19, 1055–1069 (1993).
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B. Casey, E. Kaldon, J. Sun, and W. Watters, “Application of Defect Analysis Techniques to Achieve Continuous Quality and Productivity Improvements,” ICC '91, pp. 1450–1454.
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R. B. Grady and D. L. Caswell, Software Metrics: Establishing a Company-Wide Program, Chapter 8.1, Metrics Worth Collecting, Prentice-Hall, Inc., Englewood Cliffs, NJ (1987), pp. 96–104.
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K. Bassin, T. Kratschmer, and P. Santhanam, “Evaluating Software Development Objectively,” IEEE Software 15, 66–74 (November/December 1998).
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K. Bassin and P. Santhanam, “Use of Software Triggers to Evaluate Software Process Effectiveness and Capture Customer Usage Profiles,” Proceedings of the 8th International Symposium on Software Reliability Engineering, Case Studies, IEEE Computer Society Press, Los Alamitos, CA (1997), pp. 103–114.
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A. Sharp, Software Quality and Productivity, Van Nostrand Reinhold, New York (1993), pp. 347–361.
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N. Bridge, Software Quality Orthogonal Defect Classification Using Defect Data to Improve Software Development, American Society for Quality, Software Division No. 3 (1997–1998), pp. 1–8.
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K. Bassin, R. Biyani, and P. Santhanam, “Evaluating the Software Test Strategy for the 2000 Sydney Olympics,” Proceedings of the Twelfth International Symposium on Software Reliability Engineering, Hong Kong (November 2001).
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