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Intriguing technology from OOPSLA 2001 - Introduction to this special section, J. Vlissides (IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA) and D. Lea, ACM SIGPLAN Notices, 36, No. 12, 1-1 (2001).
A study of exception handling and its dynamic optimization in Java, T. Ogasawara (IBM Japan Ltd, Tokyo Res Lab, 1623-14 Shimotsuruma, Yamato, Kanagawa 2428502, Japan) et al., ACM SIGPLAN Notices, 36, No. 11, 83-95 (2001).
Efficient implementation of Java interfaces: Invokeinterface considered harmless, B. Alpern (IBM Corp, Thomas J Watson Res Ctr, POB 704, Yorktown Hts, NY 10598 USA) et al., ACM SIGPLAN Notices, 36, No. 11, 108-124 (2001).
Incremental computation of complex object queries, H. Nakamura (IBM Japan Ltd, Tokyo Res Lab, 1623-14 Shimotsuruma, Yamato, Kanagawa 2428502, Japan) , ACM SIGPLAN Notices, 36, No. 11, 156-165 (2001).
A dynamic optimization framework for a Java Just-In-Time compiler, T. Suganuma (IBM Japan Ltd, Tokyo Res Lab, 1623-14 Shimoturuma, Yamato, Kanagawa 2428502, Japan) et al., ACM SIGPLAN Notices, 36, No. 11, 180-194 (2001).
Dynamic optimistic interprocedural analysis: A framework and an application, I. Pechtchanski (NYU, Dept Comp Sci, 550 1St Ave, New York, NY 10012 USA) and V. Sarkar, ACM SIGPLAN Notices, 36, No. 11, 195-210 (2001).
Adaptive 1-D and 2-D filtering with internally passive structures, S. Basu (IBM Corp, TJ Watson Res Ctr, New York, NY 10958 USA) and A. C. Tan, AEU-International Journal of Electronics and Communications, 55, No. 6, 397-407 (2001).
Random walks with "back buttons", R. Fagin (IBM Corp, Almaden Res Ctr, Dept K53B2, 650 Harry Rd, San Jose, CA 95120 USA) et al., Annals of Applied Probability, 11, No. 3, 810-862 (2001).
A data model and algebra for probabilistic complex values, T. Eiter (Vienna Tech Univ, Inst & Ludwig Wittgenstein Lab Informat Syst, Favoritenstr 9-11, A-1040 Vienna, Austria) et al., Annals of Mathematics and Artificial Intelligence, 33, No. 2-4, 205-252 (2001).
Grain boundary transport and vapor sensing in  -sexithiophene, J. H. Schon (Bell Labs, Lucent Technol, 600 Mt Ave, Murray Hill, NJ 07974 USA) et al., Applied Physics Letters, 79, No. 24, 3965-3967 (2001).
Reversal modes of exchange-spring magnets revealed by torque magnetometry, C. L. Platt (Seagate Technol, River Pk Commons,Suite 550, Pittsburgh, PA 15203 USA) et al., Applied Physics Letters, 79, No. 24, 3992-3994 (2001).
Interlayer coupling and magnetic reversal of antiferromagnetically coupled media, D. T. Margulies (IBM Corp, Almaden Res Ctr, 650 Harry Rd, San Jose, CA 95120 USA) et al., Applied Physics Letters, 80, No. 1, 91-93 (2002).
A search for environmental influence on stellar mass, B. G. Elmegreen (IBM Corp, Div Res, TJ Watson Res Ctr, POB 218, Yorktown Hts, NY 10598 USA) and A. Krakowski, Astrophysical Journal, 562, No. 1 1, 433-439 (2001).
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New polymer synthesis by nitroxide mediated living radical polymerizations, C. J. Hawker (IBM Corp, Almaden Res Ctr, 650 Harry Rd, San Jose, CA 95120 USA) et al., Chemical Reviews, 101, No. 12, 3661-3688 (2001).
A complexity-level analysis of the sensor planning task for object search, Y. M. Ye (IBM Corp, Thomas J Watson Res Ctr, POB 704, Yorktown Hts, NY 10598 USA) and J. K. Tsotsos, Computational Intelligence, 17, No. 4, 605-620 (2001).
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Designing and implementing an HR scorecard, G. Walker (IBM Corp, Corp Learning, Armonk, NY 10504 USA) and J. R. MacDonald, Human Resource Management, 40, No. 4, 365-377 (2001).
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Home networking with universal plug and play, B. A. Miller (IBM Corp, Software Solut Div, Res Triangle Pk, NC USA) et al., IEEE Communications Magazine, 39, No. 12, 104-109 (2001).
Building a digital model of Michelangelo's Florentine Pieta, F. Bernardini (IBM Corp, Thomas J Watson Res Ctr, POB 704, Yorktown Hts, NY 10598 USA) et al., IEEE Computer Graphics and Applications, 22, No. 1, 59-67 (2002).
High-accuracy flush-and-scan software diagnostic, K. Stanley (IBM Microelect, Mail Stop 9652J,1000 River St, Essex Jct, VT 05452 USA) , IEEE Design & Test of Computers, 18, No. 6, 56-62 (2001).
Links between complexity theory and constrained block coding, L. Stockmeyer (IBM Corp, Almaden Res Ctr, Div Res, San Jose, CA 95120 USA) and D. S. Modha, IEEE Transactions on Information Theory, 48, No. 1, 59-88 (2002).
Mining associations with the collective strength approach, C. C. Aggarwal (IBM Corp, TJ Watson Res Ctr, 30 Saw Mill River Rd, Hawthorne, NY 10532 USA) and P. S. Yu, IEEE Transactions on Knowledge and Data Engineering, 13, No. 6, 863-873 (2001).
Compiler-assisted multiple instruction word retry for VLIW architectures, S. K. Chen (IBM Corp, Thomas J Watson Res Ctr, POB 704, Yorktown Hts, NY 10598 USA) and W. K. Fuchs, IEEE Transactions on Parallel and Distributed Systems, 12, No. 12, 1293-1304 (2001).
On the consistency of instantaneous rigid motion estimation, T. Zhang (IBM Corp, Thomas J Watson Res Ctr, Dept Math Sci, Yorktown Hts, NY 10598 USA) and C. Tomasi, International Journal of Computer Vision, 46, No. 1, 51-79 (2001).
Data collection in the palm of your hand: A case study, K. A. Spain (IBM Corp, 555 Bailey Ave, San Jose, CA 95141 USA) et al., International Journal of Human-Computer Interaction, 13, No. 2, 231-243 (2001).
Optimized unrolling of nested loops, V. Sarkar (IBM Corp, Thomas J Watson Res Ctr, POB 704, Yorktown Hts, NY 10598 USA) , International Journal of Parallel Programming, 29, No. 5, 545-581 (2001).
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A model of image display in the optimized overdrive method for motion picture quality improvements in liquid crystal devices, H. Nakamura (IBM Res, Tokyo Res Lab, 1632-14 Shimotsuruma, Yamato 2428502, Japan) , Japanese Journal of Applied Physics Part 1, 40, No. 11, 6435-6440 (2001).
On the common substring alignment problem, G. M. Landau (Univ Haifa, Dept Comp Sci, IL-31905 Haifa, Israel) and M. Ziv-Ukelson, Journal of Algorithms, 41, No. 2, 338-359 (2001).
On bipartite and multipartite clique problems, M. Dawande (Univ Texas, Dallas, TX 75080 USA) et al., Journal of Algorithms, 41, No. 2, 388-403 (2001).
Effect of adsorbed water on perfluoropolyether-lubricated magnetic recording disks, G. W. Tyndall (IBM Corp, Almaden Res Ctr, 650 Harry Rd, San Jose, CA 95120 USA) et al., Journal of Applied Physics, 90, No. 12, 6287-6296 (2001).
Formation of C54TiSi2: Effects of niobium additions on the apparent activation energy, F. M. d'Heurle (IBM Corp, Thomas J Watson Res Ctr, POB 218, Yorktown Hts, NY 10598 USA) et al., Journal of Applied Physics, 90, No. 12, 6409-6415 (2001).
Physical and electrical characterization of Hafnium oxide and Hafnium silicate sputtered films, A. Callegari (IBM Corp, Thomas J Watson Res Ctr, POB 218, Yorktown Hts, NY 10598 USA) et al., Journal of Applied Physics, 90, No. 12, 6466-6475 (2001).
Gene expression profiling of B cell chronic lymphocytic leukemia reveals a homogeneous phenotype related to memory B cells, R. Dalla-Favera (Columbia Univ, Inst Canc Genet, Dept Pathol, 1150 St Nicholas Ave, New York, NY 10032 USA) et al., Journal of Experimental Medicine, 194, No. 11, 1625-1638 (2001).
Normalization by evaluation with typed abstract syntax, O. Danvy (Univ Aarhus, Dept Comp Sci, Ny Munkegade,Bldg 540, DK-8000 Aarhus C, Denmark) et al., Journal of Functional Programming, 11, No. 6, 673-680 (2001).
Synthesis of molecular-gripper-type dynamic receptors and STM-imaging of self-assembled monolayers on gold, F. Diederich (ETH Honggerberg, HCI, Organ Chem Lab, CH-8093 Zurich, Switzerland) et al., Journal of Materials Chemistry, 11, No. 12, 2895-2897 (2001).
Design alternatives for virtual interface architecture and an implementation on IBM netfinity NT cluster, M. Banikazemi (Ohio State Univ, Dept Comp & Informat Sci, Columbus, OH 43210 USA) et al., Journal of Parallel and Distributed Computing, 61, No. 11, 1512-1545 (2001).
On the braid groups for RP2, J. H. Wang (IBM PSC JCL, 6300 Diagonal HWY, Boulder, CO 80301 USA) , Journal of Pure and Applied Algebra, 166, No. 1-2, 203-227 (2002).
Synthesis of monodisperse nanoparticles of barium titanate: Toward a generalized strategy of oxide nanoparticle synthesis, S. O'Brien (Columbia Univ, Dept Appl Phys & Appl Math, 200 SW Mudd Bldg,500 W 120th St, New York, NY 10027 USA) et al., Journal of the American Chemical Society, 123, No. 48, 12085-12086 (2001).
Homologous topology optimization in large displacement and buckling problems, T. Sekimoto (IBM Japan Ltd, Fujisawa Off, 1 Kirihara Cho, Fujisawa, Kanagawa 2528555, Japan) and H. Noguchi, JSME International Journal Series A, 44, No. 4, 616-622 (2001).
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Formation of mixed layers derived from functional silicon oxide clusters on gold, M. M. B. Holl (Univ Michigan, Dept Chem, Ann Arbor, MI 48109 USA) et al., Langmuir, 17, No. 25, 7879-7885 (2001).
Multistep adsorption of perfluoropolyether hard-disk lubricants onto amorphous carbon substrates from solution, C. W. Frank (Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA) et al., Langmuir, 17, No. 26, 8145-8155 (2001).
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Decision models aid research, V. Kumar (Univ Connecticut, Storrs, CT 06269 USA) and T. Bohling, Marketing Research, 13, No. 4, 42-43 (2001).
Efficient algorithms for mining long patterns in scientific data sets, R. C. Agarwal (IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA) and C. C. Aggarwal, Massive Computing, 541-566 (2001).
Probabilistic estimation in data mining, E. P. D. Pednault (IBM Corp, Thomas J Watson Res Ctr, POB 218, Yorktown Hts, NY 10598 USA) and C. Apte, Massive Computing, 567-589 (2001).
New aspects of nanocrystal research, L. M. Liz-Marzan (Univ Vigo, Dept Phys Chem, Vigo, Spain) et al., MRS Bulletin, 26, No. 12, 981-984 (2001).
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Experimental realization of Shor's quantum factoring algorithm using nuclear magnetic resonance, I. L. Chuang (IBM Corp, Almaden Res Ctr, 650 Harry Rd, San Jose, CA 95120 USA) et al., Nature, 414, No. 6866, 883-887 (2001).
A limit on spin-charge separation in high-Tc superconductors from the absence of a vortex-memory effect, D. A. Bonn (Univ British Columbia, Dept Phys & Astron, Vancouver, BC V6T 1Z1, Canada) et al., Nature, 414, No. 6866, 887-889 (2001).
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Relating localized electronic states to host band structure in rare- earth-activated optical materials, C. W. Thiel (Montana State Univ, Dept Phys, Bozeman, MT 59717 USA) et al., Optics & Photonics News, 12, No. 12, 64-64 (2001).
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Disorder-tuning of hysteresis-loop properties in Co/CoO-film structures, A. Berger (IBM Corp, Almaden Res Ctr, 650 Harry Rd,K63-E3, San Jose, CA 95120 USA) et al., Physica B, 306, No. 1-4, 235-239 (2001).
Universal simulation of Markovian quantum dynamics, D. Bacon (Univ Calif Berkeley, Dept Chem, Berkeley, CA 94720 USA) et al., Physical Review A, 6406, No. 6, 2302+ (2001).
Use of an alkali halide molecule as a field-effect transistor, N. D. Lang (IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA) , Physical Review B, 6423, No. 23, 5121+ (2001).
Charge-induced dephasing in thin polythiophene films, E. Van Keuren (Georgetown Univ, Dept Phys, Washington, DC 20057 USA) et al., Physical Review B, 6423, No. 23, 5205+ (2001).
Morphological instability theory for strained alloy film growth: The effect of compositional stresses and species-dependent surface mobilities on ripple formation during epitaxial film deposition, B. J. Spencer (SUNY Buffalo, Dept Math, Buffalo, NY 14260 USA) et al., Physical Review B, 6423, No. 23, 5318+ (2001).
Transition temperature of ferromagnetic semiconductors: A dynamical mean field study, A. Chattopadhyay (IBM Corp, Almaden Res Ctr, 650 Harry Rd, San Jose, CA 95120 USA) et al., Physical Review Letters, 8722, No. 22, 7202+ (2001).
Ambipolar electrical transport in semiconducting single-wall carbon nanotubes, R. Martel (IBM Corp, Div Res, TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA) et al., Physical Review Letters, 8725, No. 25, 6805+ (2001).
Deroughening of a 1D domain wall in an ultrathin magnetic film by a correlated defect, L. Krusin-Elbaum (IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA) et al., Physical Review Letters, 8726, No. 26, 7201+ (2001).
Statistical physics and computational complexity, S. Kirkpatrick (IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA) and B. Selman, Princeton Series in Physics, 331-345 (2001).
The free energy landscape for ß hairpin folding in explicit water, B. J. Berne (Columbia Univ, Dept Chem, New York, NY 10027 USA) et al., Proceedings of the National Academy of Sciences of the United States of America, 98, No. 26, 14931-14936 (2001).
From compliance to control: Off-roadmap metrology for low-k(1) lithography, C. P. Ausschnitt (IBM Corp, Adv Semiconductor Technol Ctr, Hopewell Jct, NY 12533 USA) , Proceedings of the Society of Photo-Optical Instrumentation Engineers, 1-11 (2001).
Resolution enhancement techniques in optical lithography, it's not just a mask problem, L. W. Liebmann (IBM Corp, Microelect Div, 2070 Route 52, Hopewell Jct, NY 12533 USA) , Proceedings of the Society of Photo-Optical Instrumentation Engineers, 23-32 (2001).
Inspectability study of advanced photomasks with OPC structures, M. Cross (IBM Corp, Microelect, 1000 River Rd, Essex Jct, VT 05452 USA) and K. Bhattacharyya, Proceedings of the Society of Photo-Optical Instrumentation Engineers, 32-36 (2001).
PREVAIL - EPL alpha toot electron optics subsystem, H. C. Pfeiffer (IBM Microelect, Semicond Res & Dev Ctr, E Fishkill,ZIP AP1,2070 Route 52, Hopewell Jct, NY 12533 USA) et al., Proceedings of the Society of Photo-Optical Instrumentation Engineers, 70-79 (2001).
Automated search method for AFM and profilers, M. Ray (IBM Corp, Microelect, Essex Jct, VT 05452 USA) and Y. C. Martin, Proceedings of the Society of Photo-Optical Instrumentation Engineers, 72-78 (2001).
An audio watermarking method robust against time- and frequency-fluctuation, R. Tachibana (IBM Japan Ltd, Tokyo Res Lab, Yamato, Kanagawa 162314, Japan) et al., Proceedings of the Society of Photo-Optical Instrumentation Engineers, 104-115 (2001).
Maintaining a legal status for filmless archived digital medical images, U. Shani (IBM Haifa Res Lab, MATAM, IL-31905 Haifa, Israel) , Proceedings of the Society of Photo-Optical Instrumentation Engineers, No. 28, 109-117 (2001).
Optimization of segmented alignment marks for advanced semiconductor fabrication processes, Q. Wu (IBM Corp, Microelect, Semicond R&D Ctr, Hopewell Jct, NY 12533 USA) et al., Proceedings of the Society of Photo-Optical Instrumentation Engineers, 234-244 (2001).
Limitations and requirements of content-based multimedia authentication systems, C. W. Wu (IBM Corp, Thomas J Watson Res Ctr, Div Res, POB 218, Yorktown Hts, NY 10598 USA) , Proceedings of the Society of Photo-Optical Instrumentation Engineers, 241-252 (2001).
A high performance e-beam resist coupling excellent dry etch resistance and sub 100nm resolution for advanced mask and device making, W. S. Huang (IBM Microelect, Hopewell Jct, NY 12533 USA) et al., Proceedings of the Society of Photo-Optical Instrumentation Engineers, 268-277 (2001).
A high performance e-beam resist coupling excellent dry etch resistance and sub 100nm resolution for advanced mask making, D. Medeiros (IBM Corp, Microelect, Hopewell Jct, NY 12533 USA) et al., Proceedings of the Society of Photo-Optical Instrumentation Engineers, 287-297 (2001).
Tunable anti-reflective coatings with built-in hard mask properties facilitating thin resist processing, A. P. Mahorowala (IBM Corp, Thomas J Watson Res Ctr, Route 134, Yorktown Hts, NY 10598 USA) et al., Proceedings of the Society of Photo-Optical Instrumentation Engineers, 306-316 (2001).
Practical monitor and control of SEM astigmatism in manufacturing, S. Dupuis (IBM Microelect, Essex Jct, VT 05452 USA) et al., Proceedings of the Society of Photo-Optical Instrumentation Engineers, 344-354 (2001).
Application of invisible image watermarks to produce remotely printed, duplication resistant, and demonstrably authentic documents, G. W. Braudaway (IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA) et al., Proceedings of the Society of Photo-Optical Instrumentation Engineers, 351-359 (2001).
Three dimensional top down metrology: A viable alternative to AFM or cross section?, E. Solecky (IBM Adv Semicond Technol Ctr, Hopewell Jct, NY 12533 USA) et al., Proceedings of the Society of Photo-Optical Instrumentation Engineers, 366-376 (2001).
An evaluation and comparison of the pattern transfer induced image placement distortions on e-beam projection lithography masks, C. Magg (IBM Corp, Next Generat Lithog Mask Ctr Competency Photron, Essex Jct, VT 05452 USA) et al., Proceedings of the Society of Photo-Optical Instrumentation Engineers, 374-382 (2001).
Monitoring printing fidelity with image correlation measurements on the CD SEM, C. Archie (IBM Corp, Adv Semiconductor Technol Ctr, Hopewell Jct, NY 12533 USA) et al., Proceedings of the Society of Photo-Optical Instrumentation Engineers, 385-394 (2001).
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Application of the low-loss scanning electron microscope image to integrated circuit technology. Part II: Chemically-mechanically planarized samples, O. C. Wells (IBM Corp, Thomas J Watson Res Ctr, Div Res, POB 218,20-206, Yorktown Hts, NY 10598 USA) et al., Scanning, 23, No. 6, 366-371 (2001).
Surface science: Hitting the surface - Softly, D. J. Auerbach (IBM Corp, Almaden Res Ctr, 650 Harry Rd, San Jose, CA 95120 USA) , Science, 294, No. 5551, 2488-2489 (2001).
International collaboration in science in India and its impact on institutional performance, A. Basu (IBM Global Serv India, Golden Enclave,Airport Rd, Bangalore 560017, Karnataka, India) and R. Aggarwal, Scientometrics, 52, No. 3, 379-394 (2001).
SiGe/Si processing, D. Y. C. Lie (IBM Microelect, CRDC, Encinitas, CA USA) and K. L. Wang, Semiconductors and Semimetals, 151-197 (2001).
Rank-one approximation to high order tensors, T. Zhang (IBM Corp, Thomas J Watson Res Ctr, POB 218, Yorktown Hts, NY 10598 USA) and G. H. Golub, SIAM Journal on Matrix Analysis and Applications, 23, No. 2, 534-550 (2001).
Mining system audit data: Opportunities and challenges, W. Lee (Georgia Inst Technol, Coll Comp, Atlanta, GA 30332 USA) and W. Fan, SIGMOD Record, 30, No. 4, 35-44 (2001).
SQL multimedia and application packages (SQL/MM), J. Melton (Oracle, Sandy, UT 84093 USA) and A. Eisenberg, SIGMOD Record, 30, No. 4, 97-102 (2001).
Data mining of software development databases, T. M. Khoshgoftaar (Florida Atlantic Univ, Boca Raton, FL 33431 USA) et al., Software Quality Journal, 9, No. 3, 161-176 (2001).
Nonlinear factor analysis as a statistical method, I. Yalcin (Eli Lilly & Co, Lilly Corp Ctr, Bldg 58-2,Drop Code 0721, Indianapolis, IN 46285 USA) and Y. Amemiya, Statistical Science, 16, No. 3, 275-294 (2001).
Tribochemistry between hydrogen and diamond-like carbon films, C. Donnet (Ecole Cent Lyon, UMR 5513, Lab Tribol & Dynam Syst, BP 163- 69 131, Ecully, France) et al., Surface & Coatings Technology, 146, 286-291 (2001).
Removal of submicrometre alumina particles from silicon oxide substrates, N. Moumen (IBM Corp, Poughkeepsie, NY 12603 USA) and A. A. Busnaina, Surface Engineering, 17, No. 5, 422-424 (2001).
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Porous silica materials as low-k dielectrics for electronic and optical interconnects, J. L. Plawsky (Rensselaer Polytech Inst, Dept Chem Engn, Troy, NY 12180 USA) et al., Thin Solid Films, 398, 513-522 (2001).
From tribological coatings to low-k dielectrics for ULSI interconnects, A. Grill (IBM Corp, Thomas J Watson Res Ctr, POB 218, Yorktown Hts, NY 10598 USA) , Thin Solid Films, 398, 527-532 (2001).
Structure of the silicon-oxide interface, J. Tersoff (IBM Corp, Div Res, Thomas J Watson Res Ctr, POB 218, Yorktown Hts, NY 10599 USA) and J. Tersoff, Thin Solid Films, 400, No. 1-2, 95-100 (2001).
In situ resistivity study of copper-cobalt films: Precipitation, dissolution and phase transformation, J. M. E. Harper (IBM Corp, Thomas J Watson Res Ctr, POB 218, Yorktown Hts, NY 10598 USA) et al., Thin Solid Films, 401, No. 1-2, 298-305 (2001).
The "Millipede:" More than 1000 tips for parallel and dense data storage, P. Vettiger (IBM Corp, Zurich Res Lab, Saumerstr 4, CH-8803 Ruschlikon, Switzerland) et al., Transucers '01: Eurosensors Xv, Digest of Technical Papers, Vols 1 and 2, 1054-1057 (2001).
The contribution of thin PFPE lubricants to slider-disk spacing, A. Khurshudov (IBM Corp, Storage Technol Div, San Jose, CA USA) and R. J. Waltman, Tribology Letters, 11, No. 3-4, 143-149 (2001).
Lubricant spin-off from magnetic recording disks, T. E. Karis (IBM Corp, Almaden Res Ctr, Div Res, San Jose, CA 95120 USA) et al., Tribology Letters, 11, No. 3-4, 151-159 (2001).
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A method for generating pavement textures using the square packing technique, K. Miyata (Tokyo Inst Poluyech, Dept Media Art, 1583 Iiyama, Atsugi, Kanagawa 2430297, Japan) et al., Visual Computer, 17, No. 8, 475-490 (2001).
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