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IBM Journal of Research and Development

Soft Errors in Circuits and Systems   Volume 52, Number 3, 2008
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SEMM-2: A new generation of single-event-effect modeling tools - Author Bio

by H. H. K. Tang
Biographical sketch of author

Henry H. K. Tang IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598 (hktang@us.ibm.com). Dr. Tang is a Senior Engineer at the IBM T. J. Watson Research Center. He received his B.A. degree from Kalamazoo College in 1974 (magna cum laude, honors in physics and mathematics, Phi Beta Kappa). He received his Ph.D. degree in 1979 (theoretical physics) from Yale University, where he was a Heyl Predoctoral Fellow. He was a member of the research staff at the Massachusetts Institute of Technology, the Niels Bohr Institute at the University of Copenhagen, and the Cyclotron Institute at the Texas A&M University. In 1986, Dr. Tang joined IBM at East Fishkill to work on the company's first modeling toolset for particle-induced soft-error analysis. Other areas he has worked on include the modeling of advanced devices and NVRAM (nonvolatile RAM) technology. In 2001, he joined his present group at Yorktown Heights to focus on new radiation-related technology issues, and to develop a new generation of single-event-effect models and design tools. Dr. Tang has authored and coauthored more than 40 research papers, and he has mentored a number of experimental nuclear physics programs. In 2007, he was awarded an Invention Achievement Award and an Outstanding Technical Achievement Award.


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