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IBM Journal of Research and Development
Soft Errors in Circuits and Systems   Volume 52, Number 3, 2008
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Single-event-upset and alpha-particle emission rate measurement techniques - References

 by M. S. Gordon,
K. P. Rodbell,
D. F. Heidel,
C. Cabral, Jr.,
E. H. Cannon,
and D. D. Reinhardt
References

  1. R. C. Baumann, “Soft Errors in Advanced Semiconductor Devices—Part I: The Three Radiation Sources,” IEEE Trans. Device Mater. Rel. 1, No. 1, 17–22 (2001).
  2. M. S. Gordon, P. Goldhagen, K. P. Rodbell, T. H. Zabel, H. H. K. Tang, J. M. Clem, and P. Bailey, “Measurement of the Flux and Energy Spectrum of Cosmic-Ray Induced Neutrons on the Ground,” IEEE Trans. Nucl. Sci. 51, No. 6, 3427–3434 (2004).
  3. J. F. Ziegler, “Terrestrial Cosmic Rays,” IBM J. Res. & Dev. 40, No. 1, 19–40 (1996).
  4. Alpha Sciences, Inc., Model 1950 Low Background Alpha Particle Counter; see http://www.alphacounting.com/ASI-website-1950-counter.htm.
  5. J. F. Ziegler, H. W. Curtis, H. P. Muhlfeld, C. J. Montrose, B. Chin, M. Nicewicz, C. A. Russell, et al., “IBM Experiments in Soft Fails in Computer Electronics (1978–1994),” IBM J. Res. & Dev. 40, No. 1, 3–18 (1996).
  6. C. Cabral, M. Gordon, C. Plettner, and K. P. Rodbell, “Large-area Alpha-Particle Detector and Method for Use,” U.S. Patent Pending, Serial No. 11/835475, August 2007.
  7. H. H. K. Tang and E. H. Cannon, “SEMM-2: A Modeling System for Single Event Upset Analysis,” IEEE Trans. Nucl. Sci. 51, No. 6, 3342–3348 (2004).
  8. H. H. K. Tang, “SEMM-2: A New Generation of Single-Event-Effect Modeling Tools,” IBM J. Res. & Dev. 52, No. 3, 233–244 (2008, this issue).
  9. P. C. Murley and G. R. Srinivasan, “Soft-Error Monte Carlo Modeling Program, SEMM,” IBM J. Res. & Dev. 40, No. 1, 109–118 (1996).
  10. E. H. Cannon, D. D. Reinhardt, M. S. Gordon, and P. S. Makowenskyj, “SRAM SER in 90, 130 and 180 nm Bulk and SOI Technologies,” Proceedings of the IEEE International Reliability Physics Symposium, pp. 300–304, 2004.
  11. A. KleinOsowski, E. H. Cannon, P. Oldiges, and L. Wissel, “Circuit Design and Modeling for Soft Errors,” IBM J. Res. & Dev. 52, No. 3, 255–263 (2008, this issue).
  12. Negative Ion Beam Sources: Source of Negative Ions by Cesium Sputtering—SNICS II; see http://www.pelletron.com/negion.htm.
  13. D. F. Heidel, K. P. Rodbell, P. Oldiges, M. S. Gordon, H. H. K. Tang, E. H. Cannon, and C. Plettner, “Single-Event-Upset Critical Charge Measurements and Modeling of 65 nm Silicon-on-Insulator Latches and Memory Cells,” IEEE Trans. Nucl. Sci. 53, No. 6, 3512–3517 (2006).
  14. H. H. K. Tang, C. E. Murray, G. Fiorenza, K. P. Rodbell, and M. S. Gordon, “Importance of BEOL Modeling in Single Event Effect Analysis,” IEEE Trans. Nucl. Sci. 54, No. 6, 2162–2167 (2007).
  15. H. H. K. Tang, C. E. Murray, G. Fiorenza, K. P. Rodbell, M. S. Gordon, and D. F. Heidel, “New Simulation Methodology for Effects of Radiation in Semiconductor Chip Structures,” IBM J. Res. & Dev. 52, No. 3, 245–253 (2008, this issue).
  16. J. F. Ziegler, Particle Interactions with Matter: SRIM—The Stopping and Range of Ions in Matter; see http://www.srim.org.
  17. T. H. Zabel, J. Jones, J. D. Ackaret, M. A. Gaynes, M. S. Gordon, and N. C. LaBianca, “Packaging Integrated Circuits for Accelerated Detection of Transient Particle Induced Soft Error Rates,” U.S. Patent No. 7,238,547, July 3, 2007.
  18. J. W. Kellington, R. McBeth, P. Sanda, and R. N. Kalla, “IBM® POWER6™ Processor Soft Error Tolerance Analysis Using Proton Irradiation,” Proceedings of the IEEE Workshop on Silicon Errors in Logic—Systems Effects (SELSE) Conference, Austin, TX, April 2007; see http://selse3.selse.org/Papers/28_Kellington_P.pdf.
  19. E. W. Cascio, J. M. Sisterson, J. B. Flanz, and M. S. Wagner, “The Proton Irradiation Program at the Northeast Proton Therapy Center,” IEEE Radiation Effects Data Workshop, pp. 141–144, 2003.
  20. C. E. Bohnenkamp, E. H. Cannon, E. W. Cascio, M. S. Gordon, K. P. Rodbell, and T. H. Zabel, “Automatic Exchange of Degraders in Accelerated Testing of Computer Chips,” U.S. Patent No. 7183758, February 27, 2007.
  21. JEDEC Standard: Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices, JESD89A, JEDEC Solid State Technology Association, New York, October 2006; see http://www.jedec.org/download/search/JESD89A.pdf.


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