 |
 |
System RAS implications of DRAM soft errors - References
|  |  |
by T. J. Dell
|
 |  |  |
|
-
R. H. Dennard, “Field Effect Transistor Memory,” U.S. Patent No. 3,387,286, June 4, 1968.
-
T. C. May and M. H. Woods, “Alpha-Particle-Induced Soft Errors in Dynamic Memories,” IEEE Trans. Electron Devices 26, No. 1, 2–9 (1979).
-
J. F. Ziegler and W. A. Lanford, “Effect of Cosmic Rays on Computer Memories,” Science 206, No. 4420, 776–788 (1979).
-
D. Binder, E. C. Smith, and A. B. Holman, “Satellite Anomalies from Galactic Cosmic Rays,” IEEE Trans. Nucl. Sci. 22, No. 6, 2675–2680 (1975).
-
T. J. O'Gorman, J. M. Ross, A. H. Taber, J. F. Ziegler, H. P. Muhlfeld, C. J. Montrose, H. W. Curtis, and J. L. Walsh, “Field Testing for Cosmic Ray Soft Errors in Semiconductor Memories,” IBM J. Res. & Dev. 40, No. 1, 41–50 (1996).
-
L. Lantz II, “Soft Errors Induced by Alpha Particle,” IEEE Trans. Rel. 45, No. 2, 174–179 (1996).
-
J. F. Ziegler, “The Effect of Concrete Shielding on Cosmic Ray Induced Soft Fails in Electronic Systems,” IEEE Trans. Electron Devices 28, No. 5, 560–565 (1981).
-
J. F. Ziegler, “Terrestrial Cosmic Ray Intensities,” IBM J. Res. & Dev. 42, No. 1, 117–139 (1998).
-
T. J. O'Gorman, “The Effect of Cosmic Rays on the Soft Error Rate of a DRAM at Ground Level,” IEEE Trans. Electron Devices 41, No. 4, 553–560 (1994).
-
J. F. Ziegler and H. Puchner, SER—History, Trends, and Challenges: A Guide for Designing with Memory ICs, Cypress Semiconductor Corp., San Jose, CA, 2004.
-
Tezzaron Semiconductor, “Soft Errors in Electronic Memory—A White Paper,” Version 1.1, white paper (2004); see http://tezzaron.com/about/papers/soft_errors_1_1_secure.pdf.
-
P. E. Dodd, “Device Simulation of Charge Collection and Single-Event Upset,” IEEE Trans. Nucl. Sci. 43, No. 2, 561–575 (1996).
-
H. H. K. Tang, “SEMM-2: A New Generation of Single-Event-Effect Modeling Tools,” IBM J. Res. & Dev. 52, No. 3, 233–244 (2008, this issue).
-
H. H. K. Tang, C. E. Murray, G. Fiorenza, K. P. Rodbell, M. S. Gordon, and D. F. Heidel, “New Simulation Methodology for Effects of Radiation in Semiconductor Chip Structures,” IBM J. Res. & Dev. 52, No. 3, 245–253 (2008, this issue).
-
A. KleinOsowski, E. H. Cannon, P. Oldiges, and L. Wissel, “Circuit Design and Modeling for Soft Errors,” IBM J. Res. & Dev. 52, No. 3, 255–263 (2008, this issue).
-
J. F. Ziegler, M. E. Nelson, J. D. Shell, R. J. Peterson, C. J. Gelderloos, H. P. Muhlfeld, and C. J. Montrose, “Cosmic Ray Soft Error Rates of 16-Mb DRAM Memory Chips,” IEEE J. Solid-State Circuits 33, No. 2, 246–252 (1998).
-
A. Ditali and Z. Hasnain, “Monitoring Alpha Particle Sources during Wafer Processing,” Semicond. Int. 16, No. 7, 136–140 (1993).
-
R. Baumann, T. Hossain, E. Smith, S. Murata, and H. Kitagawa, “Boron as a Primary Source of Radiation in High Density DRAMS,” Proceedings of the Symposium on VLSI Technology, Kyoto, Japan, 1995, pp. 81–82.
-
J. F. Ziegler, H. W. Curtis, H. P. Muhlfeld, C. J. Montrose, B. Chin, M. Nicewicz, C. A. Russell, et al., “IBM Experiments in Soft Fails in Computer Electronics (1978–1994),” IBM J. Res. & Dev. 40, No. 1, 3–18 (1996).
-
P. Mazumder, “An On-Chip ECC Circuit for Correcting Soft Errors in DRAMs with Trench Capacitors,” IEEE J. Solid-State Circuits 27, No. 11, 1623–1633 (1992).
-
H. L. Kalter, C. H. Stapper, J. E. Barth, Jr., J. Di Lorenzo, C. E. Drake, J. A. Fifield, G. A. Kelley, Jr., S. C. Lewis, W. B. van der Hoeven, and J. A. Yankosky, “A 50 ns 16 Mb DRAM with a 10 ns Data Rate and On-chip ECC,” IEEE J. Solid-State Circuits 25, No. 5, 1118–1128 (1990).
-
F. J. Aichelmann, Jr., “Fault-Tolerant Design Techniques for Semiconductor Memory Applications,” IBM J. Res. & Dev. 28, No. 2, 177–183 (1984).
-
L. C. Alves, M. L. Fair, P. J. Meaney, C. L. Chen, W. J. Clarke, G. C. Wellwood, N. E. Weber, I. N. Modi, B. K Tolan, and F. Freier, “RAS Design for the IBM eServer z900,” IBM J. Res. & Dev. 46, No. 4/5, 503–521 (2002).
-
T. V. Rajeevakumar, N. C. C. Lu, W. H. Henkels, W. Hwang, and R. Franch, “A New Failure Mode of Radiation-Induced Soft Errors in Dynamic Memories,” IEEE Elect. Device Letters 9, No. 12, 644–646 (1988).
-
M. Ohmacht, R. A. Bergamaschi, S. Bhattacharya, A. Gara, M. E. Giampapa, B. Gopalsamy, R. A. Haring, et al., “Blue Gene/L Compute Chip: Memory and Ethernet Subsystem,” IBM J. Res. & Dev. 49, No. 2/3, 255–264 (2005).
-
D. C. Bossen, A. Kitamorn, K. F. Reick, and M. S. Floyd, “Fault-Tolerant Design of the IBM pSeries 690 System Using POWER4 Processor Technology,” IBM J. Res. & Dev. 46, No. 1, 77–86 (2002).
-
C. L. Chen and M. Y. Hsiao, “Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review,” IBM J. Res. & Dev. 28, No. 2, 124–134 (1984).
-
T. J. Dell, “A White Paper on the Benefits of Chipkill-Correct ECC for PC Server Main Memory,” IBM Corporation, white paper; see http://www.ece.umd.edu/courses/enee759h.S2003/references/ibm_chipkill.pdf.
-
S. Satoh, Y. Tosaka, and S. A. Wender, “Geometric Effect of Multiple-Bit Soft Errors Induced by Cosmic Ray Neutrons on DRAM's,” IEEE Elect. Device Lett. 21, No. 6, 310–312 (2000).
-
C. L. Chen, “Symbol Error Correcting Codes for Memory Applications,” Proceedings of the 26th International Symposium on Fault-Tolerant Computing, Sendai, Japan, 1996, pp. 200–207.
-
C. Slayman, M. Ma, and S. Lindley, “Impact of Error Correction Code and Dynamic Memory Reconfiguration on High-Reliability/Low-Cost Server Memory,” Proceedings of the IEEE Integrated Reliability Workshop, South Lake Tahoe, CA, 2006, pp. 190–193.
-
C. W. Slayman, “Cache and Memory Error Detection, Correction, and Reduction Techniques for Terrestrial Servers and Workstations,” IEEE Trans. Device Materials Rel. 5, No. 3, 397–404 (2005).
-
C. L. Chen, N. N. Tendolkar, A. J. Sutton, M. Y. Hsiao, and D. C. Bossen, “Fault-Tolerance Design of the IBM Enterprise System/9000 Type 9021 Processors,” IBM J. Res. & Dev. 36, No. 4, 765–780 (1992).
-
D. J. Henderson, A. Kitamorn, W. L. Lemmon, N. Nayer, and R. A. Shankar, “Method and Apparatus for Coordinating Dynamic Memory Deallocation with a Redundant Bit Line Steering Mechanism,” U.S. Patent No. 7,058,072, June 6, 2006.
|
|