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IBM Journal of Research and Development
Soft Errors in Circuits and Systems   Volume 52, Number 3, 2008
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Soft-error resilience of the IBM POWER6 processor input/output subsystem - References

 by C. Bender,
P. N. Sanda,
P. Kudva,
R. Mata,
V. Pokala,
R. Haraden,
and M. Schallhorn
References

  1. S. Lin and D. J. Costello, Jr., Error Control Coding: Fundamentals and Applications, Prentice Hall, Englewood Cliffs, NJ, 1983.
  2. D. J. Stigliani, Jr., T. E. Bubb, D. F. Casper, J. H. Chin, S. G. Glassen, J. M. Hoke, V. A. Minassian, J. H. Quick, and C. H. Whitehead, “IBM eServer z900 I/O Subsystem,” IBM J. Res. & Dev. 46, No. 4/5, 421–445 (2002).
  3. C. Constantinescu, J. Maiz, N. Seifert, and S. Stadler, “Logic Soft Errors in Servers,” Proceedings of the Workshop on the System Effects of Logic Soft Errors, SELSE-1, Urbana–Champaign, IL, 2005; see http://www.crhc.uiuc.edu/SELSE/pubs/05_Cristian_L_SER.pdf.
  4. K. Reick, P. N. Sanda, S. Swaney, J. W. Kellington, M. Mack, M. Floyd, and D. Henderson, “Fault-Tolerant Design of the IBM POWER6™ Microprocessor,” IEEE Micro, in press (2008).
  5. H. Q. Le, W. J. Starke, J. S. Fields, F. P. O'Connell, D. Q. Nguyen, B. J. Ronchetti, W. M. Sauer, E. M. Schwarz, and M. T. Vaden, “IBM POWER6 Microarchitecture,” IBM J. Res. & Dev. 51, No. 6, 639–662 (2007).
  6. E. W. Casio, J. M. Sisterson, J. B. Flanz, and M. S. Wagner, “The Proton Irradiation Program at the Northeast Proton Therapy Center,” Proceedings of the IEEE Radiation Effects Data Workshop, Monterey, CA, 2003, pp. 141–144.
  7. P. N. Sanda, J. W. Kellington, P. Kudva, R. Kalla, R. B. McBeth, J. Ackaret, R. Lockwood, J. Schumann, and C. R. Jones, “Soft-Error Resilience of the IBM POWER6 Processor,” IBM J. Res. & Dev. 52, No. 3, 275–284 (2008, this issue).


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