Mark B. Ketchen IBM Research Division, 2050 Rt. 52, Hopewell Junction, New York 12533 (mketchenus.ibm.com). Dr. Ketchen has a B.S. degree in physics from MIT and a Ph.D. degree in physics from the University of California at Berkeley. He served for four years as an officer in the U.S. Navy, and for the last 29 years has held a variety of research and technical management positions at IBM, including serving as Director of Physical Sciences at the IBM Thomas J. Watson Research Center for several years in the 1990s. His technical expertise is in the area of microelectronic devices and measurement techniques. He currently serves as a Senior Technical Advisor to the IBM Microelectronics Division in the design, implementation, and use of advanced semiconductor test structures. Dr. Ketchen is a Fellow of the IEEE, a Fellow of the American Physical Society, a Member of the IBM Academy of Technology, and the recipient of the 1995–1996 American Institute of Physics Prize for Industrial Applications of Physics and the 1996 IEEE Morris E. Leeds Award.

Manjul Bhushan IBM Systems and Technology Group, 2455 South Road, Poughkeepsie, New York 12601 (bhushanus.ibm.com). Dr. Bhushan received a Ph.D. degree in physics from Clemson University. She has more than thirty years of experience in basic and applied research, development, and design. Prior to joining IBM in 1997, she held university, government laboratory, and industrial positions in the areas of compound semiconductor thin-film photovoltaic cells and fabrication technology for superconducting devices used in magnetic field detection and microwave applications. She was a pioneer in the development and use of chemical–mechanical polish planarization techniques for fabricating deep-submicron superconducting tunnel junctions used in high-frequency digital logic circuits and for superconducting scanning magnetometers. Dr. Bhushan now works as a Senior Engineer in the area of CMOS technology performance characterization and evaluation and the design of test structures for process monitoring and model-to-hardware correlation for the IBM Systems and Technology Group.