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by D. C. Bossen, A. Kitamorn, K. F. Reick, and M. S. Floyd |
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References
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Nandakumar N. Tendolkar and Robert L. Swann, “Automated Diagnostic Methodology for the IBM 3081 Processor Complex,” IBM J. Res. & Dev. 26, 78–88 (January 1982).
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C. L. Chen, N. N. Tendolkar, A. J. Sutton, M. Y. Hsiao, and D. C. Bossen, “Fault-Tolerance Design of the IBM Enterprise System/9000 Type 9021 Processors,” IBM J. Res. & Dev. 36, 765–779 (July 1992).
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D. C. Bossen and M. Y. Hsiao, “Model for Transient and Permanent Error-Detection and Fault-Isolation Coverage,” IBM J. Res. & Dev. 26, 67–77 (January 1982).
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C. L. Chen and M. Y. Hsiao, “Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review,” IBM J. Res. & Dev. 28, 124–134 (March 1984).
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D. C. Bossen, L. C. Chang, and C. L. Chen, “Measurement and Generation of Error Correcting Codes for Package Failures,” IEEE Trans. Computers C-27, 203–207 (March 1978).
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