The information listed here is supplied by the Institute for Scientific Information and other outside sources. Reprints of the papers may be obtained by writing directly to the first author cited.

Journals are listed alphabetically by title; papers are listed sequentially for each journal.

A An Object-Oriented Approach to Constructing Recursive Descent Parsers, M. S. Davis (IBM Corporation, 1516 Blue Course Drive, State College, PA 16801), ACM SIGPLAN Notices 35, No. 2, 29­35 (2000). Interprocedural Pointer Alias Analysis, M. Hind (IBM Corporation, P.O. Box 704, Yorktown Heights, NY 10598) et al., ACM Transactions on Programming Languages and Systems 21, No. 4, 848­894 (1999). Linear Scan Register Allocation, M. Poletto (Massachusetts Institute of Technology, Cambridge, MA 02139) and V. Sarkar, ACM Transactions on Programming Languages and Systems 21, No. 5, 895­913 (1999). Progress in Scanning Probe Microscopy, H. K. Wickramasinghe (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598), Acta Materialia 48, No. 1, 347­358 (2000). Personal Resources and the Social Distribution of Depression, R. J. Turner (Florida International University, 11200 SW 8th Street, Miami, FL 33199) et al., American Journal of Community Psychology 27, No. 5, 643­672 (1999). Fabrication and Testing of Chemically Micromachined Silicon Echelle Gratings, L. D. Keller (Cornell University, Ithaca, NY 14853) et al., Applied Optics 39, No. 7, 1094­1105 (2000). High-Resolution Depth Profiling in Ultrathin Al2O3 Films on Si, E. P. Gusev (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., Applied Physics Letters 76, No. 2, 176­178 (2000). Structure and Stability of Ultrathin Zirconium Oxide Layers on Si(001), M. Copel (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., Applied Physics Letters 76, No. 4, 436­438 (2000). Nanoscale Magnetostrictive Response in a Thin Film Owing to a Local Magnetic Field, R. Berger (IBM Germany, D-55131 Mainz, Germany) et al., Applied Physics Letters 76, No. 5, 616­618 (2000). Two-Dimensional Magnetic Switching of Micron-Size Films in Magnetic Tunnel Junctions, A. Anguelouch (Brown University, Providence, RI 02912) et al., Applied Physics Letters 76, No. 5, 622­624 (2000). Implementation of a Three-Quantum-Bit Search Algorithm, L. M. K. Vandersypen (Stanford University, Stanford, CA 94305) et al., Applied Physics Letters 76, No. 5, 646­648 (2000). Micromagnetics of Submicron (110)Fe Elements, L. Thomas (IBM Corporation, 650 Harry Road, San Jose, CA 95120) et al., Applied Physics Letters 76, No. 6, 766­768 (2000). Perforated Tips for High-Resolution Inplane Magnetic Force Microscopy, L. Folks (IBM Corporation, 650 Harry Road, San Jose, CA 95120) et al., Applied Physics Letters 76, No. 7, 909­911 (2000). Design and Realization of an All d-wave DC -Superconducting Quantum Interference Device, R. R. Schulz (University of Augsburg, D-86135 Augsburg, Germany) et al., Applied Physics Letters 76, No. 7, 912­914 (2000). Extracting Interaction Forces and Complementary Observables in Dynamic Probe Microscopy, U. Durig (IBM Corporation, Säumerstrasse 4, 8803 Rüschlikon, Switzerland), Applied Physics Letters 76, No. 9, 1203­1205 (2000). Transplanted Si Films on Arbitrary Substrates Using GaN Underlayers, S. Guha (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., Applied Physics Letters 76, No. 10, 1264­1266 (2000). Determination of Pore-Size Distribution in Low-Dielectric Thin Films, D. W. Gidley (University of Michigan, Ann Arbor, MI 48109) et al., Applied Physics Letters 76, No. 10, 1282­1284 (2000). Influence of Molybdenum on the Formation of C54 TiSi2: Template Phenomenon Versus Grain-Size Effect, S. L. Zhang (Kungliga Tekniska Högskolan, Electrum 229, SE-16440 Kista, Sweden) and F. M. d'Heurle, Applied Physics Letters 76, No. 14, 1831­1833 (2000). Plasma-Induced Surface Segregation and Oxidation in Nickel-Iron Thin Films, R. Hsiao (IBM Corporation, 5600 Cottle Road, San Jose, CA 95193) and D. Mauri, Applied Surface Science 157, No. 3, 185­190 (2000). Star Formation in a Crossing Time, B. G. Elmegreen (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598), Astrophysical Journal 530, No. 1, 277­281 (2000). C Deletion of the Carboxyl Terminal Exons of K-sam/FGFR2 by Short Homology-Mediated Recombination, Generating Preferential Expression of Specific Messenger RNAs, T. Ueda (National Cancer Center, Chuo Ku, 1-1 Tsukiji 5 Chome, Tokyo 1040045, Japan) et al., Cancer Research 59, No. 24, 6080­6086 (1999). Bias-Tuned Reduction of Self-Absorption in Polymer Blend Electroluminescence, B. Ruhstaller (IBM Corporation, 650 Harry Road, San Jose, CA 95120) et al., Chemical Physics Letters 317, No. 3­5, 238­244 (2000). Supercritical CO2 Processing for Submicron Imaging of Fluoropolymers, N. Sundararajan (Cornell University, Ithaca, NY 14853) et al., Chemistry of Materials 12, No. 1, 41­48 (2000). Effect of Thermal Annealing on the Optical and Morphological Properties of (AETH)PbX4 (X = Br, I) Perovskite Films Prepared Using Single Source Thermal Ablation, K. Chondroudis (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., Chemistry of Materials 12, No. 1, 169­175 (2000). Surface Structure Tuning in Alcohol Melts by Bulk Additives, O. Gang (Bar Ilan University, IL-52900 Ramat Gan, Israel) et al., Colloids and Surfaces A 164, No. 1, 55­61 (2000). On Entropy and Monotonicity for Real Cubic Maps (with an Appendix by Douady, Adrien and Sentenac, Pierrette), J. Milnor (State University of New York, Stony Brook, NY 11794) and C. Tresser, Communications in Mathematical Physics 209, No. 1, 123­178 (2000). Partnerships in the US Telecommunications Industry, V. Grover (University of South Carolina, Columbia, SC 29208) and P. Vaswani, Communications of the ACM 43, No. 2, 80­89 (2000). Biometric Identification, A. Jain (Michigan State University, East Lansing, MI 48824) et al., Communications of the ACM 43, No. 2, 90­98 (2000). The KidsRoom, A. F. Bobick (Georgia Institute of Technology, Atlanta, GA 30332) et al., Communications of the ACM 43, No. 3, 60­61 (2000). Efficient Compression of Non-Manifold Polygonal Meshes, A. Gueziec (Multigen Paradigm, 550 South Winchester Boulevard, Suite 500, San Jose, CA 95128) et al., Computational Geometry 14, No. 1­3, 137­166 (1999). Biometrics: The Future of Identification, S. Pankanti (IBM Corporation, P.O. Box 704, Yorktown Heights, NY 10598) et al., Computer 33, No. 2, 46­49 (2000). Welcome to the Opportunities of Binary Translation, E. R. Altman (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., Computer 33, No. 3, 40­45 (2000). Dynamic and Transparent Binary Translation, M. Gschwind (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., Computer 33, No. 3, 54+ (2000). Key Establishment Protocols for Secure Mobile Communications: A Critical Survey, C. Boyd (Queensland University of Technology, Brisbane, Queensland 4001, Australia) and A. Mathuria, Computer Communications 23, No. 5­6, 575­587 (2000). An Adaptive Framework for 3-D Graphics Over Networks, B. O. Schneider (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) and I. M. Martin, Computers & Graphics 23, No. 6, 867­874 (1999). Cryptographic Information Recovery Using Key Recovery, M. Smith (IBM Corporation, Armonk, NY 10504) et al., Computers & Security 19, No. 1, 21­27 (2000). Features, Attributes, Characteristics, and Traits (Facts) of Key Recovery Schemes/Products, M. Willett (IBM Corporation, Armonk, NY 10504), Computers & Security 19, No. 1, 28­30 (2000). Key Recovery Functional Model, J. Kennedy (IBM Corporation, Armonk, NY 10504) et al., Computers & Security 19, No. 1, 31­36 (2000). Additional Key Recovery Functions, S. M. Matyas (IBM Corporation, Armonk, NY 10504) and N. Zunic, Computers & Security 19, No. 1, 37­40 (2000). Global Interoperability for Key Recovery, C. Williams (Cylink, Sunnyvale, CA 94086) and N. Zunic, Computers & Security 19, No. 1, 48­55 (2000). Public Key Infrastructure: Analysis of Existing and Needed Protocols and Object Formats for Key Recovery, S. Gupta (IBM Corporation, Armonk, NY 10504) and S. M. Matyas, Computers & Security 19, No. 1, 56­68 (2000). Organization Implementation Guidelines for Recovery of Encrypted Information, A. Maclean (IBM Corporation, Armonk, NY 10504) et al., Computers & Security 19, No. 1, 69­81 (2000). Organization Considerations for Retrieval of Stored Data via Key Recovery Methods, N. Zunic (IBM Corporation, Armonk, NY 10504), Computers & Security 19, No. 1, 82­85 (2000). SSL/TLS Protocol Enablement for Key Recovery, T. G. Shoriak (IBM Corporation, Armonk, NY 10504), Computers & Security 19, No. 1, 100­104 (2000). Coherent EEG Indicators of Cognitive Binding During Ambiguous Figure Tasks, W. R. Klemm (Texas A&M University, College Station, TX 77843) et al., Consciousness and Cognition 9, No. 1, 66­85 (2000). The e-Business Hat Trick: Adaptive Enterprises, Adaptable Software, Agile IT Professionals, J. Scott (1016 Long Road, Easton, PA 18040), Cutter IT Journal 13, No. 4, 7­11 (2000). D The Nitrogen Aggregation Sequence and the Formation of Voidites in Diamond, I. Kiflawi (University of Reading, Reading RG6 6AF, Great Britain) and J. Bruley, Diamond and Related Materials 9, No. 1, 87­93 (2000). Optimal Multiple Message Broadcasting in Telephone-Like Communication Systems, A. Barnoy (Tel Aviv University, IL-69978 Tel Aviv, Israel) et al., Discrete Applied Mathematics 100, No. 1­2, 1­15 (2000). Nematic Liquid-Crystal Modes for Si Wafer-Based Reflective Spatial Light Modulators, K. H. Yang (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) and M. H. Lu, Displays 20, No. 5, 211­219 (1999). E Ultrathin 600°C Wet Thermal Silicon Dioxide, J. Appenzeller (Massachusetts Institute of Technology, Cambridge, MA 02139) et al., Electrochemical and Solid State Letters 3, No. 2, 84­86 (2000). Image Enhancement for Noisy Images Using the Fuzzy Techniques, T. Kimura (IBM Japan, Ltd., 1623-14 Shimotsuruma, Yamato, Kanagawa 242, Japan) et al., Electronics and Communications in Japan Part III 83, No. 7, 1­11 (2000). I SanFrancisco Performance: A Case Study in Performance of Large-Scale Java Applications, R. Christ (IBM Corporation, 3605 Highway 52 North, Rochester, MN 55901) et al., IBM Systems Journal 39, No. 1, 4­20 (2000). Java Programming for High-Performance Numerical Computing, J. E. Moreira (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., IBM Systems Journal 39, No. 1, 21­56 (2000). Java Server Benchmarks, S. J. Baylor (IBM Corporation, P.O. Box 704, Yorktown Heights, NY 10598) et al., IBM Systems Journal 39, No. 1, 57­81 (2000). A Unifying Approach to Performance Analysis in the Java Environment, W. P. Alexander (IBM Corporation, 11400 Burnet Road, Austin, TX 78758) et al., IBM Systems Journal 39, No. 1, 118­134 (2000). The Evolution of a High-Performing Java Virtual Machine, W. Gu (IBM Corporation, 11400 Burnet Road, Austin, TX 78758) et al., IBM Systems Journal 39, No. 1, 135­150 (2000). Java Server Performance: A Case Study of Building Efficient, Scalable Jvms, R. Dimpsey (IBM Corporation, 11400 Burnet Road, Austin, TX 78758) et al., IBM Systems Journal 39, No. 1, 151­174 (2000). Overview of the IBM Java Just-in-Time Compiler, T. Suganuma (IBM Japan, Ltd., 1623-14 Shimotsuruma, Yamato, Kanagawa 242, Japan) et al., IBM Systems Journal 39, No. 1, 175­193 (2000). Building a Java Virtual Machine for Server Applications: The Jvm on OS/390, D. Dillenberger (IBM Corporation, P.O. Box 704, Yorktown Heights, NY 10598) et al., IBM Systems Journal 39, No. 1, 194­210 (2000). The Jalapeño Virtual Machine, B. Alpern (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., IBM Systems Journal 39, No. 1, 211­238 (2000). The Dependence of Channel Length on Channel Width in Narrow-Channel CMOS Devices for 0.35­0.13-µm Technologies, T. B. Hook (IBM Corporation, Essex Junction, VT 05452) et al., IEEE Electron Device Letters 21, No. 2, 85­87 (2000). Extremely High Transconductance Ge/Si0.4Ge0.6 P-MODFETs Grown by UHV­CVD, S. J. Koester (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., IEEE Electron Device Letters 21, No. 3, 110­112 (2000). High-Performance Web Site Design Techniques, A. Iyengar (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., IEEE Internet Computing 4, No. 2, 17­26 (2000). An Autocompensating Fiberoptic Quantum Cryptography System Based on Polarization Splitting of Light, D. S. Bethune (IBM Corporation, 650 Harry Road, San Jose, CA 95120) and W. P. Risk, IEEE Journal of Quantum Electronics 36, No. 3, 340­347 (2000). A Scannable Pulse-to-Static Conversion Register Array for Self-Timed Circuits, W. Hwang (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., IEEE Journal of Solid-State Circuits 35, No. 1, 125­128 (2000). Adaptive Allocation of Resources and Call Admission Control for Wireless ATM Using Genetic Algorithms, M. R. Sherif (City University of New York, New York, NY 10031) et al., IEEE Journal on Selected Areas in Communications 18, No. 2, 268­282 (2000). Authenticating Network-Attached Storage, B. C. Reed (IBM Corporation, 650 Harry Road, San Jose, CA 95120) et al., IEEE Micro 20, No. 1, 49­57 (2000). Altivec Extension to PowerPC Accelerates Media Processing, K. Diefendorff (Cahners Microdesign Resources, 298 South Sunnyvale Avenue, Sunnyvale, CA 94086) et al., IEEE Micro 20, No. 2, 85­95 (2000). Next Generation Indoor Infrared LANs: Issues and Approaches, T. Ozugur (Georgia Institute of Technology, Atlanta, GA 30332) et al., IEEE Personal Communications 6, No. 6, 6­19 (1999). Void-Effect Modeling of Flip-Chip Encapsulation on Ceramic Substrate, T. M. Niu (IBM Corporation, Endicott, NY 13760) et al., IEEE Transactions on Components, Hybrids, and Manufacturing Technology 22, No. 4, 484­487 (1999). Adhesion Issues in Flip-Chip on Organic Modules, S. K. Tran (IBM Corporation, Endicott, NY 13760) et al., IEEE Transactions on Components, Hybrids, and Manufacturing Technology 22, No. 4, 519­524 (1999). Equivalent Elmore Delay for RLC Trees, Y. I. Ismail (University of Rochester, 601 Elmwood Avenue, Rochester, NY 14627) et al., IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 19, No. 1, 83­97 (2000). Transient Sensitivity Computation in Controlled Explicit Piecewise Linear Simulation, T. V. Nguyen (IBM Corporation, Research Laboratory, Austin, TX 78717) et al., IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 19, No. 1, 98­110 (2000). Wide-Band Home Phone Line Characterization, D. Liu (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., IEEE Transactions on Consumer Electronics 46, No. 1, 76­86 (2000). A New Model for the Description of Gate Voltage and Temperature Dependence of Gate-Induced Drain Leakage (GIDL) in the Low Electric Field Region, M. Rosar (Procter & Gamble Co., Frankfurt, Germany) et al., IEEE Transactions on Electron Devices 47, No. 1, 154­159 (2000). MOSFET Channel Length: Extraction and Interpretation, Y. Taur (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598), IEEE Transactions on Electron Devices 47, No. 1, 160­170 (2000). The Influence of Ge Grading on the Bias and Temperature Characteristics of SiGeHBTs for Precision Analog Circuits, S. L. Salmon (Maxim Integrated Products, Beaverton, OR 97005) et al., IEEE Transactions on Electron Devices 47, No. 2, 292­298 (2000). A Channel Resistance Derivative Method for Effective Channel-Length Extraction in LDD MOSFET, G. F. Niu (Auburn University, Auburn, AL 36849) et al., IEEE Transactions on Electron Devices 47, No. 3, 648­650 (2000). Lossless Sliding Block Compression of Constrained Systems, J. L. Fan (Stanford University, Stanford, CA 94309) et al., IEEE Transactions on Information Theory 46, No. 2, 624­633 (2000). SNR and Density Limit Estimates: A Comparison of Longitudinal and Perpendicular Recording, H. N. Bertram (University of California, La Jolla, CA 92093) and M. Williams, IEEE Transactions on Magnetics 36, No. 1, 4­9 (2000). High Ku Materials Approach to 100 Gbits/in.2, D. Weller (IBM Corporation, 650 Harry Road, San Jose, CA 95120) et al., IEEE Transactions on Magnetics 36, No. 1, 10­15 (2000). The Feasibility of Magnetic Recording at 1 Terabit per Square Inch, R. Wood (IBM Corporation, 5600 Cottle Road, San Jose, CA 95193), IEEE Transactions on Magnetics 36, No. 1, 36­42 (2000). Microstructure and Thermal Stability of Advanced Longitudinal Media, M. F. Doerner (IBM Corporation, 5600 Cottle Road, San Jose, CA 95193), IEEE Transactions on Magnetics 36, No. 1, 43­47 (2000). Media Noise, Nonlinear Distortions, and Thermal Stability in a High-Density Recording, A. Taratorin (IBM Corporation, 650 Harry Road, San Jose, CA 95120) et al., IEEE Transactions on Magnetics 36, No. 1, 80­85 (2000). Correlation of Thermal Stability and Signal-to-Noise Ratio of Thin-Film Recording Media, T. C. Arnoldussen (IBM Corporation, 5600 Cottle Road, San Jose, CA 95193) et al., IEEE Transactions on Magnetics 36, No. 1, 92­97 (2000). New Methodologies for Measuring Film Thickness, Coverage, and Topography, C. M. Mate (IBM Corporation, 650 Harry Road, San Jose, CA 95120) et al., IEEE Transactions on Magnetics 36, No. 1, 110­114 (2000). High Magnetoresistance in Sputtered Permalloy Thin Films Through Growth on Seed Layers of (Ni0.81Fe0.19)1­x Crx, W. Y. Lee (IBM Corporation, 650 Harry Road, San Jose, CA 95120) et al., IEEE Transactions on Magnetics 36, No. 1, 381­385 (2000). Magnetic Properties, Microstructures, and Corrosion Resistance of High-Saturation FeMoN and FeRhN Films for Recording Heads, S. X. Wang (Stanford University, Stanford, CA 94305) et al., IEEE Transactions on Magnetics 36, No. 2, 513­520 (2000). Anomalous Dose Rate Effects in Gamma-Irradiated SiGe Heterojunction Bipolar Transistors, G. Banerjee (Auburn University, Auburn, AL 36849) et al., IEEE Transactions on Nuclear Science 46, No. 6, 1620­1626 (1999). The Effects of Proton Irradiation on the RF Performance of SiGeHBTs, S. M. Zhang (Auburn University, Auburn, AL 36849) et al., IEEE Transactions on Nuclear Science 46, No. 6, 1716­1721 (1999). Total Dose Effects on the Shallow Trench Isolation Leakage Current Characteristics in a 0.35-µm SiGeBiCMOS Technology, G. Niu (Auburn University, Auburn, AL 36849) et al., IEEE Transactions on Nuclear Science 46, No. 6, 1841­1847 (1999). Data Mining for Features Using Scale-Sensitive Gated Experts, A. N. Srivastava (IBM Corporation, 650 Harry Road, San Jose, CA 95120) et al., IEEE Transactions on Pattern Analysis and Machine Intelligence 21, No. 12, 1268­1279 (1999). Holistic Verification of Handwritten Phrases, S. Madhvanath (IBM Corporation, 650 Harry Road, San Jose, CA 95120) et al., IEEE Transactions on Pattern Analysis and Machine Intelligence 21, No. 12, 1344­1356 (1999). Statistical Pattern Recognition: A Review, A. K. Jain (Michigan State University, East Lansing, MI 48824) et al., IEEE Transactions on Pattern Recognition and Machine Intelligence 22, No. 1, 4­37 (2000). Level-Specific Lithography Optimization for 1 GB DRAM, A. K. Wong (IBM Corporation, Route 52, Hopewell Junction, NY 12533) et al., IEEE Transactions on Semiconductor Manufacturing 13, No. 1, 76­87 (2000). A Survey of Smoothing Techniques for ME Models, S. F. Chen (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) and R. Rosenfeld, IEEE Transactions on Speech and Audio Processing 8, No. 1, 37­50 (2000). Model Complexity Adaptation Using a Discriminant Measure, A. Padmanabhan (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) and L. R. Bahl, IEEE Transactions on Speech and Audio Processing 8, No. 2, 205­208 (2000). The Ball-Pivoting Algorithm for Surface Reconstruction, F. Bernardini (IBM Corporation, P.O. Box 704, Yorktown Heights, NY 10598) et al., IEEE Transactions on Visualization and Computer Graphics 5, No. 4, 349­359 (1999). Improved Track Following in Magnetic Disk Drives Using a Disturbance Observer, M. T. White (IBM Corporation, 650 Harry Road, San Jose, CA 95120) et al., IEEE–ASME Transactions on Mechatronics 5, No. 1, 3­11 (2000). Resonance Frequency Variation with a Nearby Floated Metal Plate, A. Sakurai (IBM Japan, Ltd., 1623-14 Shimotsuruma, Yamato, Kanagawa 242, Japan) et al., IEICE Transactions on Communications E83B, No. 3, 555­560 (2000). Pupil Detection and Tracking Using Multiple Light Sources, C. H. Morimoto (University Sao Paulo, Rua Matao 1010, BR-05508900 Sao Paulo, Brazil) et al., Image and Vision Computing 18, No. 4, 331­335 (2000). Periodic Points for Onto Cellular Automata, M. Boyle (University of Maryland, College Park, MD 20742) and B. Kitchens, Indagationes Mathematicae 10, No. 4, 483­493 (1999). Preparation of Thin Coatings of Titanium Compounds with Ion Implantation, M. Mozetic (Institute of Surface Engineering & Optoelectronics, Ljubljana 1000, Slovenia) et al., Informacije Midem–Journal of Microelectronics, Electronic Components, and Materials 29, No. 3, 117­120 (1999). A 3-Approximation Algorithm for the K-Level Uncapacitated Facility Location Problem, K. Aardal (University of Utrecht, P.O. Box 80089, NL-3508 TB Utrecht, Netherlands) et al., Information Processing Letters 72, No. 5­6, 161­167 (1999). The IT Imperative in Business Transformation, R. J. Murray (Nolan Nortan & Company, Los Angeles, CA) and D. E. Trefts, Information Systems Management 17, No. 1, 17­22 (2000). Design, Structure, and Optical Properties of Organic­ Inorganic Perovskites Containing an Oligothiophene Chromophore, D. B. Mitzi (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., Inorganic Chemistry 38, No. 26, 6246­6256 (1999). Fabrication of Multilayer Ferroelectric Films, D. A. Neumayer (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., Integrated Ferroelectrics 25, No. 1­4, 615­626 (1999). Properties of Zirconium Doped Sr­Bi­Ta­O Thin Films, R. Barz (Arizona State University, Tempe, AZ 85287) et al., Integrated Ferroelectrics 25, No. 1­4, 627­637 (1999). Combinatorial Cell Design for CMOS Libraries, F. Beeftink (Delft University of Technology, Delft, Netherlands) et al., Integration–The VLSI Journal 29, No. 1, 67­93 (2000). Cooperative Multiobjective Decision Support for the Paper Industry, S. Murthy (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., Interfaces 29, No. 5, 5­30 (1999). Capacity Optimization Planning System (CAPS), S. Bermon (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) and S. J. Hood, Interfaces 29, No. 5, 31­49 (1999). Extended Enterprise Supply Chain Management at IBM Personal Systems Group and Other Divisions, G. Lin (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., Interfaces 30, No. 1, 7­25 (2000). Enhanced Co-Scheduling: A Software Pipelining Method Using Module-Scheduled Pipeline Theory, R. Govindarajan (Indian Institute of Science, Bangalore 560012, Karnataka, India) et al., International Journal of Parallel Programming 28, No. 1, 1­46 (2000). Exchange and Correlation Energy in Density-Functional Theory, R. K. Nesbet (IBM Corporation, 650 Harry Road, San Jose, CA 95120), International Journal of Quantum Chemistry 77, No. 2, 521­525 (2000). Pathological Foliations and Removable Zero Exponents, M. Shub (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) and A. Wilkinson, Inventiones Mathematicae 139, No. 3, 495­508 (2000). J Using Java Server Pages: Servlets Made Simple–A Look at the JSP Specification and What It Adds to Standard HTML and How JSPs Are Used to Generate Server-Side Java, K. Brown (IBM Corporation, P.O. Box 12195, Research Triangle Park, NC 27709) and G. Craig, Java Report 4, No. 8, 41+ (1999). Durable APIs: Serialization, M. Davis (IBM Corporation, Java Technology, Silicon Valley, CA), Java Report 4, No. 8, 65+ (1999). Design Patterns for Business Frameworks and Applications, B. Carlson (IBM Corporation, Rochester, MN 55901), Java Report 5, No. 3, 34+ (2000). Object Caching with the Threadlocal Class, J. Raley (IBM Corporation, Cupertino, CA), Java Report 5, No. 4, 28+ (2000). Hashing and Cloning, M. Davis (IBM Corporation, Armonk, NY 10504), Java Report 5, No. 4, 60+ (2000). Greedily Finding a Dense Subgraph, Y. Asahiro (Kyushu University, Fukuoka 812, Japan) et al., Journal of Algorithms 34, No. 2, 203­221 (2000). Cavities and Dislocations Induced in Silicon by MeV He Implantation, S. Godey (National Center of Scientific Research, 3A Rue Ferollerie, F-45071 Orleans 2, France) et al., Journal of Applied Physics 87, No. 5, 2158­2161 (2000).

J     Cont'd Dissociation of Dilute Immiscible Copper Alloy Thin Films, K. Barmak (Carnegie Mellon University, Pittsburgh, PA 15213) et al., Journal of Applied Physics 87, No. 5, 2204­2214 (2000). Diffusion of Implanted Nitrogen in Silicon, L. S. Adam (University of Florida, Gainesville, FL 32611) et al., Journal of Applied Physics 87, No. 5, 2282­2284 (2000). Interface Reactions Between Quaternary Cobalt Alloys and Carbon Coating in Thin-Film Disk Media, J. U. Thiele (IBM Corporation, 5600 Cottle Road, San Jose, CA 95193) et al., Journal of Applied Physics 87, No. 6, 2989­2993 (2000). Demonstration of Quantum Logic Gates in Liquid Crystal Nuclear Magnetic Resonance, M. Marjanska (University of California, Berkeley, CA 94720) et al., Journal of Chemical Physics 112, No. 11, 5095­5099 (2000). Robust and Efficient Sharing of RSA Functions, R. Gennaro (IBM Corporation, P.O. Box 704, Yorktown Heights, NY 10598) et al., Journal of Cryptology 13, No. 2, 273­300 (2000). Watching Chips Work: Picosecond Hot Electron Light Emission from Integrated Circuits, J. A. Kash (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) and J. C. Tsang, Journal of Crystal Growth 210, No. 1­3, 318­322 (2000). Atomic Step Dynamics on Periodic Semiconductor Surface Structures, J. M. Blakely (Cornell University, Ithaca, NY 14853) et al., Journal of Electron Microscopy 48, No. 6, 747­752 (1999). Testing for Function and Performance: Towards an Integrated Processor Validation Methodology, P. Bose (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598), Journal of Electronic Testing 16, No. 1­2, 29­48 (2000). An Efficient Logic Equivalence Checker for Industrial Circuits, J. Park (IBM Corporation, 11400 Burnet Road, Austin, TX 78758) et al., Journal of Electronic Testing 16, No. 1­2, 91­106 (2000). Shot-Noise Measurements in Diffusive Normal Metal Superconductor (N-S) Junctions, A. A. Kozhevnikov (Yale University, New Haven, CT 06520) et al., Journal of Low Temperature Physics 118, No. 5­6, 671­678 (2000). Direct Process Thermal Line Broadening in Tm:YAG, R. M. Macfarlane (IBM Corporation, 650 Harry Road, San Jose, CA 95120), Journal of Luminescence 85, No. 4, 181­186 (2000). Optimization of TaSiN Thin Films for Use as Oxidation-Resistant Diffusion Barriers, C. Cabral (IBM Corporation, P.O. Box 218, Yorktown Heights, NY 10598) et al., Journal of Materials Research 15, No. 1, 194­198 (2000). Does an Exact Local Exchange Potential Exist: Questionable, R. K. Nesbet (IBM Corporation, 650 Harry Road, San Jose, CA 95120) and R. Colle, Journal of Mathematical Chemistry 26, No. 1, 233­242 (1999). Air-Bearing Sliders and Plane-Plane Concave Tips for Atomic Force Microscope Cantilevers, R. P. Ried (Input Output Inc., Stafford, TX 77477) et al., Journal of Microelectromechanical Systems 9, No. 1, 52­57 (2000). 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