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IBM Journal of Research and Development  
Volume 40, Number 1, 1996
Terrestrial cosmic rays and soft errors
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IBM experiments in soft fails in computer electronics (1978-1994) - References
by J. F. Ziegler, H. W. Curtis, H. P. Muhlfeld, C. J. Montrose, B. Chin, M. Nicewicz, C. A. Russell, W. Y. Wang, L. B. Freeman, P. Hosier, L. E. LaFave, J. L. Walsh, J. M. Orro, G. J. Unger, J. M. Ross, T. J. O'Gorman, B. Messina, T. D. Sullivan, A. J. Sykes, H. Yourke, T. A. Enger, V. Tolat, T. S. Scott, A. H. Taber, R. J. Sussman, W. A. Klein, and C. W. Wahaus

References

  1. M. Faraday, Experimental Researches in Electricity, 1839-1855, three-volume Everyman Edition, Quaritech., London, 1951.
  2. P. C. Murley and G. R. Srinivasan, "Soft-Error Monte Carlo Modeling Program, SEMM,'' IBM J. Res. Develop. 40, 109-118 and references cited therein (1996, this issue); G. R. Srinivasan, P. C. Murley, and H. K. Tang, IEEE Trans. Nucl. Sci. 41, 2063-2070 (1994); G. R. Srinivasan, "Modeling the Cosmic-Ray-Induced Soft-Error Rate in Integrated Circuits: An Overview,'' IBM J. Res. Develop. 40, 77-89 (1996, this issue).
  3. J. F. Ziegler, "Terrestrial Cosmic Rays,'' IBM J. Res. Develop. 40, 19-39 (1996, this issue).
  4. J. F. Ziegler, H. P. Muhlfeld, C. J. Montrose, H. W. Curtis, T. J. O'Gorman, and J. M. Ross, "Accelerated Testing for Cosmic Soft-Error Rate,'' IBM J. Res. Develop. 40, 51-72 (1996, this issue).
  5. T. J. O'Gorman, J. M. Ross, A. H. Taber, J. F. Ziegler, H. P. Muhlfeld, C. J. Montrose, H. W. Curtis, and J. L. Walsh, "Field Testing for Cosmic Ray Soft Errors in Semiconductor Memories,'' IBM J. Res. Develop. 40, 41-50 (1996, this issue).
  6. Annals of the IQSY, the summary of the International Research on the Quiet Sun Years, Vols. 1-7, MIT Press, Cambridge, MA, 1968-1970.
  7. D. Binder, E. C. Smith, and A. B. Holman, IEEE Trans. Nucl. Sci. NS-22, 2675 (1975).
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  10. J. F. Ziegler and W. A. Lanford, J. Appl. Phys. 52, 4305 (1981); see also J. F. Ziegler, IEEE Trans. Electron Devices ED-28, 560 (1981).
  11. W. A. Kolasinski et al., IEEE Trans. Nucl. Sci. NS-26, 5087 (1979).
  12. C. S. Guenzer, E. A. Wolicki, and R. G. Allas, IEEE Trans. Nucl. Sci. NS-26, 5048 (1979). A more complete study is their follow-up article: C. S. Guenzer, R. G. Allas, A. B. Campbell, J. W. Kidd, E. L. Petersen, N. Seeman, and E. A. Wolicki, IEEE Trans. Nucl. Sci. NS-26, 5048 (1979). See also R. C. Wyatt, P. J. McNulty, P. Toumbas, P. L. Rothwell, and R. C. Fitz, IEEE Trans. Nucl. Sci. NS-26, 4905 (1979).
  13. P. J. McNulty, G. E. Farrell, R. C. Wyatt, P. L. Rothwell, R. C. Filz, and J. N. Bradford, IEEE Trans. Nucl. Sci. NS-27, 1516 (1980); E. L. Petersen, IEEE Trans. Nucl. Sci. NS-27, 1494 (1980); J. N. Bradford, IEEE Trans. Nucl. Sci. NS-27, 1480 (1980). A recent review of these early studies can be found in Microelectronics for the Natural Radiation Environments of Space, P. J. McNulty, Ed., IEEE Press, New York, 1992.
  14. S. Kirkpatrick, IEEE Trans. Electron Devices ED-26, 1742 (1979).
  15. G. A. Sai-Halasz and M. R. Wordeman, IEEE Electron Device Lett. EDL-1, 211 (1980).
  16. C. M. Hsieh, P. C. Murley, and R. R. O'Brien, IEEE Electron Device Lett. EDL-2, 103 (1981). See also C. H. Hsieh, P. C. Murley, and R. R. O'Brien, Proceedings of the 19th Annual IEEE International Reliability Physics Symposium, 1981, p. 38; and C. H. Hsieh, P. C. Murley, and R. R. O'Brien, IEEE Trans. Electron Devices ED-30, 686 (1983).
  17. M. R. Wordeman, R. H. Dennard, and G. A. Sai-Halasz, IEDM Tech. Digest 40 (December 1981). See also G. A. Sai-Halasz, M. R. Wordeman, and R. H. Dennard, IEEE Trans. Electron Devices ED-29, 725 (1982), and G. A. Sai-Halasz and D. D. Tang, IEDM Tech. Digest 83, 344 (1983).
  18. J. F. Dicello, IEEE Trans. Nucl. Sci. NS-30, 4613 (1983).
  19. A. Taber and E. Normand, IEEE Trans. Nucl. Sci. 40, 120 (1993).
  20. A. Taber and E. Normand, 1993 U.S. Government Microcircuit Applications Conference Digest of Papers XIX, 223-226 (November 1993); available from the U.S. Defense Technical Information Center, Cameron Station, VA.
  21. L. M. Geppert, U. Bapst, D. F. Heidel, and K. A. Jenkins, IEEE J. Solid-State Circuits 26, 132 (1991); D. F. Heidel, U. H. Bapst, K. A. Jenkins, L. M. Geppert, and T. H. Zabel, IEEE Trans. Nucl. Sci. 40, 127 (1993).
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